Ventura, S., & Luna, J. M. (2020). Supervised Descriptive Pattern Mining. Springer International Publishing.
Trích dẫn kiểu ChicagoVentura, Sebastián, và José María Luna. Supervised Descriptive Pattern Mining. Springer International Publishing, 2020.
MLA引文Ventura, Sebastián, và José María Luna. Supervised Descriptive Pattern Mining. Springer International Publishing, 2020.
警告:這些引文格式不一定是100%准確.