Kirkland, E. J. (2020). Advanced Computing in Electron Microscopy. Springer International Publishing.
Style de citation ChicagoKirkland, Earl J. Advanced Computing in Electron Microscopy. Springer International Publishing, 2020.
Style de citation MLAKirkland, Earl J. Advanced Computing in Electron Microscopy. Springer International Publishing, 2020.
Attention : ces citations peuvent ne pas être correctes à 100%.