Fundamentals of dimensional metrology /

This book is about: Measurement and metrology; Measurement, Gaging, and tolerances; Statistics and metrology; Language and systems of measurement; Vernier instruments; ...

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Bibliographic Details
Main Author: Busch, Ted.
Other Authors: Harlow, Roger., Thompson, Richard.
Format: Book
Language:English
Published: Albany, NY : Delmar, 1998.
Edition:3rd ed.
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Institutions: Mạng thư viện Đại học Đà Nẵng