APA aipamena

(2006). VLSI test principles and architectures: Design for testability. Amsterdam: Elsevier Morgan Kaufmann Publishers.

Chicago Style aipamena

VLSI Test Principles and Architectures: Design for Testability. Amsterdam: Elsevier Morgan Kaufmann Publishers, 2006.

MLA aipamena

VLSI Test Principles and Architectures: Design for Testability. Amsterdam: Elsevier Morgan Kaufmann Publishers, 2006.

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