(2006). VLSI test principles and architectures: Design for testability. Amsterdam: Elsevier Morgan Kaufmann Publishers.
Trích dẫn kiểu ChicagoVLSI Test Principles and Architectures: Design for Testability. Amsterdam: Elsevier Morgan Kaufmann Publishers, 2006.
MLA citiranjeVLSI Test Principles and Architectures: Design for Testability. Amsterdam: Elsevier Morgan Kaufmann Publishers, 2006.
Opozorilo: Ti citati niso vedno 100% točni.