APA citiranje

(2006). VLSI test principles and architectures: Design for testability. Amsterdam: Elsevier Morgan Kaufmann Publishers.

Trích dẫn kiểu Chicago

VLSI Test Principles and Architectures: Design for Testability. Amsterdam: Elsevier Morgan Kaufmann Publishers, 2006.

MLA citiranje

VLSI Test Principles and Architectures: Design for Testability. Amsterdam: Elsevier Morgan Kaufmann Publishers, 2006.