Citazione APA

(2006). VLSI test principles and architectures: Design for testability. Amsterdam: Elsevier Morgan Kaufmann Publishers.

Stile di citazione Chicago

VLSI Test Principles and Architectures: Design for Testability. Amsterdam: Elsevier Morgan Kaufmann Publishers, 2006.

Citazione MLA

VLSI Test Principles and Architectures: Design for Testability. Amsterdam: Elsevier Morgan Kaufmann Publishers, 2006.

Attenzione: Queste citazioni potrebbero non essere precise al 100%.