Dyfyniad APA

(2006). VLSI test principles and architectures: Design for testability. Amsterdam: Elsevier Morgan Kaufmann Publishers.

Dyfyniad Arddull Chicago

VLSI Test Principles and Architectures: Design for Testability. Amsterdam: Elsevier Morgan Kaufmann Publishers, 2006.

Dyfyniad MLA

VLSI Test Principles and Architectures: Design for Testability. Amsterdam: Elsevier Morgan Kaufmann Publishers, 2006.

Rhybudd: Mae'n bosib nad yw'r dyfyniadau hyn bob amser yn 100% cywir.