Long memory testing in the time domain /
Wedi'i Gadw mewn:
| Prif Awdur: | Demetrescu, Matei. |
|---|---|
| Awduron Eraill: | Hassler, Uwe., Kuzin, Vladimir. |
| Fformat: | Erthygl |
| Iaith: | English |
| Pynciau: | |
| Tagiau: |
Ychwanegu Tag
Dim Tagiau, Byddwch y cyntaf i dagio'r cofnod hwn!
|
| Thư viện lưu trữ: | Thư viện Trường Đại học Đà Lạt |
|---|
Eitemau Tebyg
-
Testing for long memory /
gan: Harris, David. -
Alternative frequency and time domain versions of fractional Brownian motion /
gan: Davidson, James. -
Error control for a time-discretization of the full one-dimensional Fremond model for shape memory alloys /
gan: Stefanelli, Ulisse. -
The work of memory : Time, identity, and justice /
gan: Booth, W. James. -
Semiconductor Memories: Technology, Testing, and Reliability
gan: Ashok, K. Sharma
Cyhoeddwyd: (2026)