Kim, Y., Lee, J., & Yu, I. Fabrication and characterization of silicon probe tip for vertical probe card using MEMS technology.
استشهاد بنمط شيكاغوKim, Young-Min., Jong-Hyun Lee, و In-Sik Yu. Fabrication and Characterization of Silicon Probe Tip for Vertical Probe Card Using MEMS Technology.
MLA استشهادKim, Young-Min., Jong-Hyun Lee, و In-Sik Yu. Fabrication and Characterization of Silicon Probe Tip for Vertical Probe Card Using MEMS Technology.
تحذير: قد لا تكون هذه الاستشهادات دائما دقيقة بنسبة 100%.