Kim, Y., Lee, J., & Yu, I. Fabrication and characterization of silicon probe tip for vertical probe card using MEMS technology.
Style de citation ChicagoKim, Young-Min., Jong-Hyun Lee, et In-Sik Yu. Fabrication and Characterization of Silicon Probe Tip for Vertical Probe Card Using MEMS Technology.
Style de citation MLAKim, Young-Min., Jong-Hyun Lee, et In-Sik Yu. Fabrication and Characterization of Silicon Probe Tip for Vertical Probe Card Using MEMS Technology.
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