Chu, B., Han, B., Ko, S., & Yang, S. Relationship between secondary electrom emissions and film thickness of hydrogenated amorphous silicon.
Stile di citazione ChicagoChu, Byung-Yoon., Byoung-Sung Han, Seok-Cheol Ko, e Sung-Chae Yang. Relationship between Secondary Electrom Emissions and Film Thickness of Hydrogenated Amorphous Silicon.
Citazione MLAChu, Byung-Yoon., Byoung-Sung Han, Seok-Cheol Ko, e Sung-Chae Yang. Relationship between Secondary Electrom Emissions and Film Thickness of Hydrogenated Amorphous Silicon.
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