Cita APA

Chu, B., Han, B., Ko, S., & Yang, S. Relationship between secondary electrom emissions and film thickness of hydrogenated amorphous silicon.

Citación estilo Chicago

Chu, Byung-Yoon., Byoung-Sung Han, Seok-Cheol Ko, y Sung-Chae Yang. Relationship between Secondary Electrom Emissions and Film Thickness of Hydrogenated Amorphous Silicon.

Cita MLA

Chu, Byung-Yoon., Byoung-Sung Han, Seok-Cheol Ko, y Sung-Chae Yang. Relationship between Secondary Electrom Emissions and Film Thickness of Hydrogenated Amorphous Silicon.