Chu, B., Han, B., Ko, S., & Yang, S. Relationship between secondary electrom emissions and film thickness of hydrogenated amorphous silicon.
Chicago ZitierstilChu, Byung-Yoon., Byoung-Sung Han, Seok-Cheol Ko, und Sung-Chae Yang. Relationship between Secondary Electrom Emissions and Film Thickness of Hydrogenated Amorphous Silicon.
MLA ZitierstilChu, Byung-Yoon., Byoung-Sung Han, Seok-Cheol Ko, und Sung-Chae Yang. Relationship between Secondary Electrom Emissions and Film Thickness of Hydrogenated Amorphous Silicon.
Achtung: Diese Zitate sind unter Umständen nicht zu 100% korrekt.