APA-referens

Chu, B., Han, B., Ko, S., & Yang, S. Relationship between secondary electrom emissions and film thickness of hydrogenated amorphous silicon.

Chicago-stil citat

Chu, Byung-Yoon., Byoung-Sung Han, Seok-Cheol Ko, och Sung-Chae Yang. Relationship between Secondary Electrom Emissions and Film Thickness of Hydrogenated Amorphous Silicon.

MLA-referens

Chu, Byung-Yoon., Byoung-Sung Han, Seok-Cheol Ko, och Sung-Chae Yang. Relationship between Secondary Electrom Emissions and Film Thickness of Hydrogenated Amorphous Silicon.

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