Relationship between secondary electrom emissions and film thickness of hydrogenated amorphous silicon /

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Bibliografische gegevens
Andere auteurs:	Chu, Byung-Yoon., Han, Byoung-Sung., Ko, Seok-Cheol., Yang, Sung-Chae.
Formaat:	Artikel
Taal:	English
Onderwerpen:	Hydrogenated amorphous silicon Paschen's law Spectroscopy
Tags:	Voeg label toe Geen labels, Wees de eerste die dit record labelt!

Thư viện lưu trữ:	Thư viện Trường Đại học Đà Lạt

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Relationship between secondary electrom emissions and film thickness of hydrogenated amorphous silicon /

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