Moon, H., Kim, J., & Kim, Y. Measurement of yield strength for electroplated nickel film using micro-cantilever.
Chicago Style aipamenaMoon, Hyoung-Sik., Joo-Hwan Kim, và Young-Min Kim. Measurement of Yield Strength for Electroplated Nickel Film Using Micro-cantilever.
MLA aipamenaMoon, Hyoung-Sik., Joo-Hwan Kim, và Young-Min Kim. Measurement of Yield Strength for Electroplated Nickel Film Using Micro-cantilever.
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