APA ציטוט

Moon, H., Kim, J., & Kim, Y. Measurement of yield strength for electroplated nickel film using micro-cantilever.

Trích dẫn kiểu Chicago

Moon, Hyoung-Sik., Joo-Hwan Kim, và Young-Min Kim. Measurement of Yield Strength for Electroplated Nickel Film Using Micro-cantilever.

ציטוט MLA

Moon, Hyoung-Sik., Joo-Hwan Kim, và Young-Min Kim. Measurement of Yield Strength for Electroplated Nickel Film Using Micro-cantilever.