Bae, I., Choi, S., Kim, K., Park, H., & Yu, J. Photoreflectance measurement in Si3N4/Al0.21Ga0.79As/GaAs heterostructure.
Trích dẫn kiểu ChicagoBae, In-Ho., Sang-Su Choi, Ki-Hong Kim, Hun-Bo Park, và Jae-In Yu. Photoreflectance Measurement in Si3N4/Al0.21Ga0.79As/GaAs Heterostructure.
MLA CitationBae, In-Ho., et al. Photoreflectance Measurement in Si3N4/Al0.21Ga0.79As/GaAs Heterostructure.
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