Photoreflectance measurement in Si3N4/Al0.21Ga0.79As/GaAs heterostructure /

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Detalles Bibliográficos
Outros autores:	Bae, In-Ho., Choi, Sang-Su., Kim, Ki-Hong., Park, Hun-Bo., Yu, Jae-In.
Formato:	Artigo
Idioma:	English
Những chủ đề:	Heterostructure
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Photoreflectance measurement in Si3N4/Al0.21Ga0.79As/GaAs heterostructure /

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