एपीए उद्धरण

Blenkinsopp, P., Hill, R., Lockyer, N., Vickerman, J. C., Weibel, D., & Wong, S. A C60 primary ion beam system for time of flight secondary ion mass spectrometry: Its development and secondary ion yield characteristics.

शिकागो स्टाइल उद्धरण

Blenkinsopp, Paul., Rowland Hill, Nicholas Lockyer, John C. Vickerman, Daniel Weibel, और Steve Wong. A C60 Primary Ion Beam System for Time of Flight Secondary Ion Mass Spectrometry: Its Development and Secondary Ion Yield Characteristics.

एमएलए उद्धरण

Blenkinsopp, Paul., et al. A C60 Primary Ion Beam System for Time of Flight Secondary Ion Mass Spectrometry: Its Development and Secondary Ion Yield Characteristics.