Awane, T., Ishikawa, N., Kimura, T., Nakamura, M., Nishida, K., & Tanuma, S. Grazing exit electron probe microanalysis of submicrometer inclusions in metallic materials.
Chicago Style CitationAwane, Tohru., Nobuhiro Ishikawa, Takashi Kimura, Morihiko Nakamura, Kenji Nishida, and Shigeo Tanuma. Grazing Exit Electron Probe Microanalysis of Submicrometer Inclusions in Metallic Materials.
MLA CitationAwane, Tohru., et al. Grazing Exit Electron Probe Microanalysis of Submicrometer Inclusions in Metallic Materials.
Warning: These citations may not always be 100% accurate.