Awane, T., Ishikawa, N., Kimura, T., Nakamura, M., Nishida, K., & Tanuma, S. Grazing exit electron probe microanalysis of submicrometer inclusions in metallic materials.
シカゴスタイル引用形Awane, Tohru., Nobuhiro Ishikawa, Takashi Kimura, Morihiko Nakamura, Kenji Nishida, , Shigeo Tanuma. Grazing Exit Electron Probe Microanalysis of Submicrometer Inclusions in Metallic Materials.
MLA引用形式Awane, Tohru., et al. Grazing Exit Electron Probe Microanalysis of Submicrometer Inclusions in Metallic Materials.
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