APA引文

Awane, T., Ishikawa, N., Kimura, T., Nakamura, M., Nishida, K., & Tanuma, S. Grazing exit electron probe microanalysis of submicrometer inclusions in metallic materials.

Trích dẫn kiểu Chicago

Awane, Tohru., Nobuhiro Ishikawa, Takashi Kimura, Morihiko Nakamura, Kenji Nishida, và Shigeo Tanuma. Grazing Exit Electron Probe Microanalysis of Submicrometer Inclusions in Metallic Materials.

MLA引文

Awane, Tohru., et al. Grazing Exit Electron Probe Microanalysis of Submicrometer Inclusions in Metallic Materials.