Awane, T., Ishikawa, N., Kimura, T., Nakamura, M., Nishida, K., & Tanuma, S. Grazing exit electron probe microanalysis of submicrometer inclusions in metallic materials.
Trích dẫn kiểu ChicagoAwane, Tohru., Nobuhiro Ishikawa, Takashi Kimura, Morihiko Nakamura, Kenji Nishida, và Shigeo Tanuma. Grazing Exit Electron Probe Microanalysis of Submicrometer Inclusions in Metallic Materials.
MLA citiranjeAwane, Tohru., et al. Grazing Exit Electron Probe Microanalysis of Submicrometer Inclusions in Metallic Materials.
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