APA aipamena

Awane, T., Ishikawa, N., Kimura, T., Nakamura, M., Nishida, K., & Tanuma, S. Grazing exit electron probe microanalysis of submicrometer inclusions in metallic materials.

Chicago Style aipamena

Awane, Tohru., Nobuhiro Ishikawa, Takashi Kimura, Morihiko Nakamura, Kenji Nishida, và Shigeo Tanuma. Grazing Exit Electron Probe Microanalysis of Submicrometer Inclusions in Metallic Materials.

MLA aipamena

Awane, Tohru., et al. Grazing Exit Electron Probe Microanalysis of Submicrometer Inclusions in Metallic Materials.