Huffman, S. W., Levin, I. W., Schaeberle, M. D., & Schlucker, S. Raman microspectroscopy: A comparison of point, line, wide-field imaging methodologies.
Trích dẫn kiểu ChicagoHuffman, Scott W., Ira W. Levin, Michael D. Schaeberle, và Sebastian Schlucker. Raman Microspectroscopy: A Comparison of Point, Line, Wide-field Imaging Methodologies.
MLA引文Huffman, Scott W., Ira W. Levin, Michael D. Schaeberle, và Sebastian Schlucker. Raman Microspectroscopy: A Comparison of Point, Line, Wide-field Imaging Methodologies.
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