May, C. J., Canavan, H. E., & Castner, D. G. Quantitative X-ray photoelectron spectroscopy and time-of-flight secondary ion mass spectrometry characterization of the components in DNA.
Styl cytowania ChicagoMay, Collin J., Heather E. Canavan, i David G. Castner. Quantitative X-ray Photoelectron Spectroscopy and Time-of-flight Secondary Ion Mass Spectrometry Characterization of the Components in DNA.
Styl cytowania MLAMay, Collin J., Heather E. Canavan, i David G. Castner. Quantitative X-ray Photoelectron Spectroscopy and Time-of-flight Secondary Ion Mass Spectrometry Characterization of the Components in DNA.
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