Advances in X-ray analysis : proceedings...annual Conference on Application of X-ray Analysis.

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Advances in X-ray analysis : proceedings...annual Conference on Application of X-ray Analysis. t.III /

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Xehetasun bibliografikoak
Formatua:	Sách giấy
Hizkuntza:	English
Argitaratua:	Denver, Colorado : University of Denver, 1960.
Etiketak:	Etiketa erantsi Etiketarik gabe, Izan zaitez lehena erregistro honi etiketa jartzen!

Thư viện lưu trữ:	Thư viện Trường Đại học Đà Lạt

Antzeko izenburuak

Advances in X-Ray analysis.
Argitaratua: (1963)

Introduction to X-ray spectrometric analysis
nork: Bertin, Eugene P
Argitaratua: (2013)

Principles and practice of X-ray spectrometric analysis
nork: Bertin, Eugene P
Argitaratua: (2014)

Material investigation and analysis using characteristic X-ray /
nork: Oh, G.

X-rays for Archaeology
nork: Uda, M., et al.
Argitaratua: (2020)

Capillary electrophoresis micro X-ray fluorescence : A tool for benchtop elemental analysis /

Sampling, storage and sample preparation procedures for x ray fluorescence analysis of environmental materials
nork: International Atomic Energy Agency
Argitaratua: (2014)

Handbook of X-ray data
nork: Zschornack, Günter
Argitaratua: (2013)

Quantitative x-ray spectrometry
nork: Jenkins, Ron, et al.
Argitaratua: (2014)

X-Ray Contrast Media
nork: Speck, Ulrich
Argitaratua: (2020)

X-Ray Lasers 2016
nork: Kawachi, Tetsuya, et al.
Argitaratua: (2020)

Quantitative X-Ray Diffractometry
nork: Zevin, Lev S, et al.
Argitaratua: (2014)

X-rays in theory and experiment
nork: Compton, Arthur Holly, et al.
Argitaratua: (2013)

An introduction to X-ray crystallography
nork: Woolfson, M M
Argitaratua: (2013)

X-Ray Lasers 2018
nork: Kozlová, Michaela, et al.
Argitaratua: (2020)

Handbook of X-ray spectrometry
nork: VanGriekan, ReneE, et al.
Argitaratua: (2013)

A Monte Carlo program for quantitative electron-induced X-ray analysis of individual particles /

ANALYSIS OF TRACE ELEMENT CONCENTRATIONS IN ARTICHOKES AT DALAT USING TOTAL REFLECTION X-RAY FLUORESCENCE
nork: Nguyễn, Thị Minh Sang, et al.
Argitaratua: (2023)

ANALYSIS OF TRACE ELEMENT CONCENTRATIONS IN ARTICHOKES AT DALAT USING TOTAL REFLECTION X-RAY FLUORESCENCE
nork: Nguyễn, Thị Minh Sang, et al.
Argitaratua: (2024)

Elements of X-ray diffraction
nork: Cullity, B. D.
Argitaratua: (2001)

Elements of X-Ray diffraction
nork: Cullity, B. D.
Argitaratua: (2001)

Frontiers of X-ray astronomy
Argitaratua: (2004)

From X-Rays to Quarks :
nork: Segre, Emilio
Argitaratua: (1980)

Surface Sterilization and X-ray Radiography of Woodblocks by Low-energy X-rays —Technology Transfer to Vietnam
nork: Noriaki Kataoka, et al.
Argitaratua: (2025)

MSWI fly ash particle analysis by scanning electron microscopy-energy dispersive X-ray spectroscopy /

Elements of modern X-ray physics /
nork: Als-Nielsen, Jens
Argitaratua: (2001)

X-rays in atomic and nuclear physics
nork: Dyson, N A
Argitaratua: (2013)

X-Ray Absorption Spectroscopy of Semiconductors
nork: Schnohr, Claudia S, et al.
Argitaratua: (2016)

Elements of modern X-ray physics
nork: Nielsen, J Als, et al.
Argitaratua: (2013)

The fundamentals of X-rays and radium physics
nork: Selman, Joseph
Argitaratua: (1972)

Symposium on X-Ray lithography in Japan
nork: Davis, Keneth
Argitaratua: (1991)

Structure determination by x-ray crystallography :
nork: Ladd, Mark
Argitaratua: (2013)

X-ray scattering from semiconductors
nork: Fewster, Paul F
Argitaratua: (2000)

X-ray scattering from semiconductors
nork: Fewster, Paul F.
Argitaratua: (2000)

X-ray scattering from semiconductors /
nork: Fewster, Paul F.
Argitaratua: (2000)

X-ray scattering from semiconductors /
nork: Fewster, Paul F.
Argitaratua: (2000)

Elements of modern X-ray physics /
nork: Als-Nielsen, Jens, 1937-
Argitaratua: (2001)

X-Ray Scattering from Semiconductors
nork: Fewster, Paul F
Argitaratua: (2000)

X-ray scattering from semiconductors
nork: Fewster, Paul F
Argitaratua: (2000)

X-ray scattering from semiconductors
nork: Fewster, Paul F
Argitaratua: (2000)