APA Citatie

Tan, C. M. (2010). Electromigration in ULSI Interconnections. Singapore ; Hackensack, NJ: World Scientific.

Chicago Style citaat

Tan, Cher Ming. Electromigration in ULSI Interconnections. Singapore ; Hackensack, NJ: World Scientific, 2010.

MLA citatie

Tan, Cher Ming. Electromigration in ULSI Interconnections. Singapore ; Hackensack, NJ: World Scientific, 2010.

Let op: Deze citaties zijn niet altijd 100% accuraat.