APA citiranje

Tan, C. M. (2010). Electromigration in ULSI Interconnections. Singapore ; Hackensack, NJ: World Scientific.

Trích dẫn kiểu Chicago

Tan, Cher Ming. Electromigration in ULSI Interconnections. Singapore ; Hackensack, NJ: World Scientific, 2010.

MLA citiranje

Tan, Cher Ming. Electromigration in ULSI Interconnections. Singapore ; Hackensack, NJ: World Scientific, 2010.

Opozorilo: Ti citati niso vedno 100% točni.