APA ציטוט

Tan, C. M. (2010). Electromigration in ULSI Interconnections. Singapore ; Hackensack, NJ: World Scientific.

Trích dẫn kiểu Chicago

Tan, Cher Ming. Electromigration in ULSI Interconnections. Singapore ; Hackensack, NJ: World Scientific, 2010.

ציטוט MLA

Tan, Cher Ming. Electromigration in ULSI Interconnections. Singapore ; Hackensack, NJ: World Scientific, 2010.