Oldham Timothy R. (2000). Ionizing Radiation Effects in Mos Oxides (International Series on Advances in Solid State Electronics and Technology. Singapore: World Scientific.
Citação norma ChicagoOldham Timothy R. Ionizing Radiation Effects in Mos Oxides (International Series On Advances in Solid State Electronics and Technology. Singapore: World Scientific, 2000.
Citação norma MLAOldham Timothy R. Ionizing Radiation Effects in Mos Oxides (International Series On Advances in Solid State Electronics and Technology. Singapore: World Scientific, 2000.
Nota: a formatação da citação pode não corresponder 100% ao definido pela respectiva norma.