Oldham Timothy R. (2000). Ionizing Radiation Effects in Mos Oxides (International Series on Advances in Solid State Electronics and Technology. Singapore: World Scientific.
Style de citation ChicagoOldham Timothy R. Ionizing Radiation Effects in Mos Oxides (International Series On Advances in Solid State Electronics and Technology. Singapore: World Scientific, 2000.
Style de citation MLAOldham Timothy R. Ionizing Radiation Effects in Mos Oxides (International Series On Advances in Solid State Electronics and Technology. Singapore: World Scientific, 2000.
Attention : ces citations peuvent ne pas être correctes à 100%.