Oldham Timothy R. (2000). Ionizing Radiation Effects in Mos Oxides (International Series on Advances in Solid State Electronics and Technology. Singapore: World Scientific.
Chicago-stil citatOldham Timothy R. Ionizing Radiation Effects in Mos Oxides (International Series On Advances in Solid State Electronics and Technology. Singapore: World Scientific, 2000.
MLA-referensOldham Timothy R. Ionizing Radiation Effects in Mos Oxides (International Series On Advances in Solid State Electronics and Technology. Singapore: World Scientific, 2000.
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