Cita APA

Oldham Timothy R. (2000). Ionizing Radiation Effects in Mos Oxides (International Series on Advances in Solid State Electronics and Technology. Singapore: World Scientific.

Citación estilo Chicago

Oldham Timothy R. Ionizing Radiation Effects in Mos Oxides (International Series On Advances in Solid State Electronics and Technology. Singapore: World Scientific, 2000.

Cita MLA

Oldham Timothy R. Ionizing Radiation Effects in Mos Oxides (International Series On Advances in Solid State Electronics and Technology. Singapore: World Scientific, 2000.

Precaución: Estas citas no son 100% exactas.