Oldham Timothy R. (2000). Ionizing Radiation Effects in Mos Oxides (International Series on Advances in Solid State Electronics and Technology. Singapore: World Scientific.
استشهاد بنمط شيكاغوOldham Timothy R. Ionizing Radiation Effects in Mos Oxides (International Series On Advances in Solid State Electronics and Technology. Singapore: World Scientific, 2000.
MLA استشهادOldham Timothy R. Ionizing Radiation Effects in Mos Oxides (International Series On Advances in Solid State Electronics and Technology. Singapore: World Scientific, 2000.
تحذير: قد لا تكون هذه الاستشهادات دائما دقيقة بنسبة 100%.