Field Emission Scanning Electron Microscopy. 1st ed. 2018
Đã lưu trong:
Những tác giả chính: | Brodusch, Nicolas, Demers, Hendrix, Gauvin, Raynald |
---|---|
Formáid: | Leabhar |
Teanga: | English |
Foilsithe: |
Springer Singapore
2020
|
Ábhair: | |
Rochtain Ar Líne: | http://doi.org/10.1007/978-981-10-4433-5 https://scholar.dlu.edu.vn/thuvienso/handle/DLU123456789/102700 |
Clibeanna: |
Cuir Clib Leis
Gan Chlibeanna, Bí ar an gcéad duine leis an taifead seo a chlibeáil!
|
Thư viện lưu trữ: | Thư viện Trường Đại học Đà Lạt |
---|
Míreanna Comhchosúla
-
Scanning Electron Microscopy and X-Ray Microanalysis. 4th ed.
le: Goldstein, Joseph I., et al.
Foilsithe: (2020) -
Springer Handbook of Microscopy. 1st ed. 2019
le: Hawkes, Peter W., et al.
Foilsithe: (2020) -
Advanced Computing in Electron Microscopy
le: Kirkland, Earl J.
Foilsithe: (2020) -
Transmission Electron Microscopy. 2nd ed.
le: Williams, David B., et al.
Foilsithe: (2020) -
Noncontact Atomic Force Microscopy
le: Morita, Seizo, et al.
Foilsithe: (2020)