Field Emission Scanning Electron Microscopy. 1st ed. 2018

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Field Emission Scanning Electron Microscopy. 1st ed. 2018

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Opis bibliograficzny
Główni autorzy:	Brodusch, Nicolas, Demers, Hendrix, Gauvin, Raynald
Format:	Książka
Język:	English
Wydane:	Springer Singapore 2020
Hasła przedmiotowe:	Materials Science Characterization and Evaluation of Materials Spectroscopy and Microscopy Nanotechnology and Microengineering
Dostęp online:	http://doi.org/10.1007/978-981-10-4433-5 https://scholar.dlu.edu.vn/thuvienso/handle/DLU123456789/102700
Etykiety:	Dodaj etykietę Nie ma etykietki, Dołącz pierwszą etykiete!

Thư viện lưu trữ:	Thư viện Trường Đại học Đà Lạt

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