Electromagnetic Nondestructive Evaluation (X)
The phenomenon is very sensitive to internal stress and microstructure and the direct correlations found between such parameters and Barkhausen emissions has made it a useful tool in Non Destructive Evaluation (NDE). Today we have more powerful data collection and analyzing systems which, combine...
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IOS Press
2013
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| Truy cập trực tuyến: | https://scholar.dlu.edu.vn/thuvienso/handle/DLU123456789/35141 |
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oai:scholar.dlu.edu.vn:DLU123456789-351412014-01-20T00:10:53Z Electromagnetic Nondestructive Evaluation (X) Takahashi, Seiki Kikuchi, Hiroaki Electromagnetic Evaluation The phenomenon is very sensitive to internal stress and microstructure and the direct correlations found between such parameters and Barkhausen emissions has made it a useful tool in Non Destructive Evaluation (NDE). Today we have more powerful data collection and analyzing systems which, combined with sensors capable of accurate measurements, gives us the opportunity to exploit the effect in a broader field of applications 2013-08-21T01:58:23Z 2013-08-21T01:58:23Z 2007 Book 978-1-58603-752-9 https://scholar.dlu.edu.vn/thuvienso/handle/DLU123456789/35141 en application/pdf IOS Press |
| institution |
Thư viện Trường Đại học Đà Lạt |
| collection |
Thư viện số |
| language |
English |
| topic |
Electromagnetic Evaluation |
| spellingShingle |
Electromagnetic Evaluation Takahashi, Seiki Kikuchi, Hiroaki Electromagnetic Nondestructive Evaluation (X) |
| description |
The phenomenon is very sensitive to internal stress and microstructure and the
direct correlations found between such parameters and Barkhausen emissions has made
it a useful tool in Non Destructive Evaluation (NDE). Today we have more powerful
data collection and analyzing systems which, combined with sensors capable of
accurate measurements, gives us the opportunity to exploit the effect in a broader field
of applications |
| format |
Book |
| author |
Takahashi, Seiki Kikuchi, Hiroaki |
| author_facet |
Takahashi, Seiki Kikuchi, Hiroaki |
| author_sort |
Takahashi, Seiki |
| title |
Electromagnetic Nondestructive Evaluation (X) |
| title_short |
Electromagnetic Nondestructive Evaluation (X) |
| title_full |
Electromagnetic Nondestructive Evaluation (X) |
| title_fullStr |
Electromagnetic Nondestructive Evaluation (X) |
| title_full_unstemmed |
Electromagnetic Nondestructive Evaluation (X) |
| title_sort |
electromagnetic nondestructive evaluation (x) |
| publisher |
IOS Press |
| publishDate |
2013 |
| url |
https://scholar.dlu.edu.vn/thuvienso/handle/DLU123456789/35141 |
| _version_ |
1819806774039937024 |