Next Generation Wireless LANs: Throughput, Robustness, and Reliability in 802.11n

If you’ve been searching for a way to get up to speed quickly on IEEE 802.11n without having to wade through the entire standard, then look no further. This comprehensive overviewdescribes the underlying principles, implementation details, and key enhancing features of 802.11n. For many of these...

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Những tác giả chính: Perahia, Eldad, Stacey, Robert
Định dạng: Sách
Ngôn ngữ:English
Được phát hành: Cambridge University Press 2013
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Truy cập trực tuyến:http://scholar.dlu.edu.vn/thuvienso/handle/DLU123456789/35990
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spelling oai:scholar.dlu.edu.vn:DLU123456789-359902014-01-19T23:18:50Z Next Generation Wireless LANs: Throughput, Robustness, and Reliability in 802.11n Perahia, Eldad Stacey, Robert Wireless Lans If you’ve been searching for a way to get up to speed quickly on IEEE 802.11n without having to wade through the entire standard, then look no further. This comprehensive overviewdescribes the underlying principles, implementation details, and key enhancing features of 802.11n. For many of these features, the authors outline the motivation and history behind their adoption into the standard. A detailed discussion of the key throughput, robustness, and reliability enhancing features (such as MIMO, 40 MHz channels, and packet aggregation) is given, in addition to a clear summary of the issues surrounding legacy interoperability and coexistence. Advanced topics such as beamforming and fast link adaption are also covered. With numerous MAC and physical layer examples and simulation results included to highlight the benefits of the new features, this is an ideal reference for designers of WLAN equipment, and network managers whose systems adopt the new standard. It is also a useful distillation of 802.11n technology for graduate students and researchers in the field of wireless communication. 2013-12-18T08:46:51Z 2013-12-18T08:46:51Z 2008 Book 978-0-511-43823-3 http://scholar.dlu.edu.vn/thuvienso/handle/DLU123456789/35990 en application/pdf Cambridge University Press
institution Thư viện Trường Đại học Đà Lạt
collection Thư viện số
language English
topic Wireless
Lans
spellingShingle Wireless
Lans
Perahia, Eldad
Stacey, Robert
Next Generation Wireless LANs: Throughput, Robustness, and Reliability in 802.11n
description If you’ve been searching for a way to get up to speed quickly on IEEE 802.11n without having to wade through the entire standard, then look no further. This comprehensive overviewdescribes the underlying principles, implementation details, and key enhancing features of 802.11n. For many of these features, the authors outline the motivation and history behind their adoption into the standard. A detailed discussion of the key throughput, robustness, and reliability enhancing features (such as MIMO, 40 MHz channels, and packet aggregation) is given, in addition to a clear summary of the issues surrounding legacy interoperability and coexistence. Advanced topics such as beamforming and fast link adaption are also covered. With numerous MAC and physical layer examples and simulation results included to highlight the benefits of the new features, this is an ideal reference for designers of WLAN equipment, and network managers whose systems adopt the new standard. It is also a useful distillation of 802.11n technology for graduate students and researchers in the field of wireless communication.
format Book
author Perahia, Eldad
Stacey, Robert
author_facet Perahia, Eldad
Stacey, Robert
author_sort Perahia, Eldad
title Next Generation Wireless LANs: Throughput, Robustness, and Reliability in 802.11n
title_short Next Generation Wireless LANs: Throughput, Robustness, and Reliability in 802.11n
title_full Next Generation Wireless LANs: Throughput, Robustness, and Reliability in 802.11n
title_fullStr Next Generation Wireless LANs: Throughput, Robustness, and Reliability in 802.11n
title_full_unstemmed Next Generation Wireless LANs: Throughput, Robustness, and Reliability in 802.11n
title_sort next generation wireless lans: throughput, robustness, and reliability in 802.11n
publisher Cambridge University Press
publishDate 2013
url http://scholar.dlu.edu.vn/thuvienso/handle/DLU123456789/35990
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