Debug Automation from Pre-Silicon to Post-Silicon
In this book, we propose automated debugging approaches for the bugs and the faults which appear in different abstraction levels of a hardware system, i.e., transaction-level, RTL, and gate-level. Our automated debug approaches are applied to a hardware system at different granularities to find t...
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2015
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oai:scholar.dlu.edu.vn:DLU123456789-569432023-11-11T05:41:01Z Debug Automation from Pre-Silicon to Post-Silicon Dehbashi, Mehdi Fey, Görschwin Debug Automation In this book, we propose automated debugging approaches for the bugs and the faults which appear in different abstraction levels of a hardware system, i.e., transaction-level, RTL, and gate-level. Our automated debug approaches are applied to a hardware system at different granularities to find the possible location of bugs and faults. The transaction-based debug approach is applied to a hardware system at transaction-level asserting the correct relation of transactions. Our automated debug approach for design bugs finds the potential fault candidates at RTL and gate-level of a circuit. In this case, logic bugs and synchronization bugs are considered as they are the most difficult bugs to be localized. For electrical faults and, in particular, delay faults our proposed debug automation finds the potential failing speedpaths in a circuit at gate-level... 2015-07-08T01:59:45Z 2015-07-08T01:59:45Z 2015 Book 978-3-319-09308-6 https://scholar.dlu.edu.vn/thuvienso/handle/DLU123456789/56943 en application/pdf Springer |
| institution |
Thư viện Trường Đại học Đà Lạt |
| collection |
Thư viện số |
| language |
English |
| topic |
Debug Automation |
| spellingShingle |
Debug Automation Dehbashi, Mehdi Fey, Görschwin Debug Automation from Pre-Silicon to Post-Silicon |
| description |
In this book, we propose automated debugging approaches for the bugs and
the faults which appear in different abstraction levels of a hardware system, i.e.,
transaction-level, RTL, and gate-level. Our automated debug approaches are applied
to a hardware system at different granularities to find the possible location of bugs
and faults. The transaction-based debug approach is applied to a hardware system at
transaction-level asserting the correct relation of transactions. Our automated debug
approach for design bugs finds the potential fault candidates at RTL and gate-level
of a circuit. In this case, logic bugs and synchronization bugs are considered as they
are the most difficult bugs to be localized. For electrical faults and, in particular,
delay faults our proposed debug automation finds the potential failing speedpaths in
a circuit at gate-level... |
| format |
Book |
| author |
Dehbashi, Mehdi Fey, Görschwin |
| author_facet |
Dehbashi, Mehdi Fey, Görschwin |
| author_sort |
Dehbashi, Mehdi |
| title |
Debug Automation from Pre-Silicon to Post-Silicon |
| title_short |
Debug Automation from Pre-Silicon to Post-Silicon |
| title_full |
Debug Automation from Pre-Silicon to Post-Silicon |
| title_fullStr |
Debug Automation from Pre-Silicon to Post-Silicon |
| title_full_unstemmed |
Debug Automation from Pre-Silicon to Post-Silicon |
| title_sort |
debug automation from pre-silicon to post-silicon |
| publisher |
Springer |
| publishDate |
2015 |
| url |
https://scholar.dlu.edu.vn/thuvienso/handle/DLU123456789/56943 |
| _version_ |
1782537632134201344 |