X-Ray Absorption Spectroscopy of Semiconductors

X-ray Absorption Spectroscopy (XAS) is a powerful technique with which to probe the properties of matter, equally applicable to the solid, liquid and gas phases. Semiconductors are arguably our most technologically-relevant group of materials given they form the basis of the electronic and photonic...

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Những tác giả chính:	Schnohr, Claudia S, Ridgway, Mark C
Định dạng:	Sách
Ngôn ngữ:	English
Được phát hành:	Springer 2016
Những chủ đề:	X-ray spectroscopy Industrial applications X-rays Testing Semiconductors
Truy cập trực tuyến:	https://scholar.dlu.edu.vn/thuvienso/handle/DLU123456789/59842
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spelling	oai:scholar.dlu.edu.vn:DLU123456789-598422023-11-11T06:54:01Z X-Ray Absorption Spectroscopy of Semiconductors Schnohr, Claudia S Ridgway, Mark C X-ray spectroscopy Industrial applications X-rays Testing Semiconductors X-ray Absorption Spectroscopy (XAS) is a powerful technique with which to probe the properties of matter, equally applicable to the solid, liquid and gas phases. Semiconductors are arguably our most technologically-relevant group of materials given they form the basis of the electronic and photonic devices that now so widely permeate almost every aspect of our society. The most effective utilisation of these materials today and tomorrow necessitates a detailed knowledge of their structural and vibrational properties. Through a series of comprehensive reviews, this book demonstrates the versatility of XAS for semiconductor materials analysis and presents important research activities in this ever growing field. A short introduction of the technique, aimed primarily at XAS newcomers, is followed by twenty independent chapters dedicated to distinct groups of materials. Topics span dopants in crystalline semiconductors and disorder in amorphous semiconductors to alloys and nanometric material as well as in-situ measurements of the effects of temperature and pressure. Summarizing research in their respective fields, the authors highlight important experimental findings and demonstrate the capabilities and applications of the XAS technique. This book provides a comprehensive review and valuable reference guide for both XAS newcomers and experts involved in semiconductor materials research. 2016-03-16T03:18:06Z 2016-03-16T03:18:06Z 2015 Book 978-3-662-44362-0 978-3-662-44361-3 https://scholar.dlu.edu.vn/thuvienso/handle/DLU123456789/59842 en application/pdf Springer
institution	Thư viện Trường Đại học Đà Lạt
collection	Thư viện số
language	English
topic	X-ray spectroscopy Industrial applications X-rays Testing Semiconductors
spellingShingle	X-ray spectroscopy Industrial applications X-rays Testing Semiconductors Schnohr, Claudia S Ridgway, Mark C X-Ray Absorption Spectroscopy of Semiconductors
description	X-ray Absorption Spectroscopy (XAS) is a powerful technique with which to probe the properties of matter, equally applicable to the solid, liquid and gas phases. Semiconductors are arguably our most technologically-relevant group of materials given they form the basis of the electronic and photonic devices that now so widely permeate almost every aspect of our society. The most effective utilisation of these materials today and tomorrow necessitates a detailed knowledge of their structural and vibrational properties. Through a series of comprehensive reviews, this book demonstrates the versatility of XAS for semiconductor materials analysis and presents important research activities in this ever growing field. A short introduction of the technique, aimed primarily at XAS newcomers, is followed by twenty independent chapters dedicated to distinct groups of materials. Topics span dopants in crystalline semiconductors and disorder in amorphous semiconductors to alloys and nanometric material as well as in-situ measurements of the effects of temperature and pressure. Summarizing research in their respective fields, the authors highlight important experimental findings and demonstrate the capabilities and applications of the XAS technique. This book provides a comprehensive review and valuable reference guide for both XAS newcomers and experts involved in semiconductor materials research.
format	Book
author	Schnohr, Claudia S Ridgway, Mark C
author_facet	Schnohr, Claudia S Ridgway, Mark C
author_sort	Schnohr, Claudia S
title	X-Ray Absorption Spectroscopy of Semiconductors
title_short	X-Ray Absorption Spectroscopy of Semiconductors
title_full	X-Ray Absorption Spectroscopy of Semiconductors
title_fullStr	X-Ray Absorption Spectroscopy of Semiconductors
title_full_unstemmed	X-Ray Absorption Spectroscopy of Semiconductors
title_sort	x-ray absorption spectroscopy of semiconductors
publisher	Springer
publishDate	2016
url	https://scholar.dlu.edu.vn/thuvienso/handle/DLU123456789/59842
_version_	1782533855918424064

X-Ray Absorption Spectroscopy of Semiconductors

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