Digital Noise Monitoring of Defect Origin
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| Tác giả chính: | |
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| Định dạng: | Sách |
| Ngôn ngữ: | English |
| Được phát hành: |
Springer US
2020
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| Những chủ đề: | |
| Truy cập trực tuyến: | http://scholar.dlu.edu.vn/thuvienso/handle/DLU123456789/83917 |
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| Thư viện lưu trữ: | Thư viện Trường Đại học Đà Lạt |
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oai:scholar.dlu.edu.vn:DLU123456789-839172020-02-24T09:29:21Z Digital Noise Monitoring of Defect Origin Aliev, Telman Engineering Signal, Image and Speech Processing Applications of Mathematics Communications Engineering, Networks 2020-02-24T09:29:21Z 2020-02-24T09:29:21Z 2007 Book 978-0-387-71753-1 978-0-387-71754-8 http://scholar.dlu.edu.vn/thuvienso/handle/DLU123456789/83917 en Lecture Notes in Electrical Engineering Springer-Verlag US application/pdf Springer US |
| institution |
Thư viện Trường Đại học Đà Lạt |
| collection |
Thư viện số |
| language |
English |
| topic |
Engineering Signal, Image and Speech Processing Applications of Mathematics Communications Engineering, Networks |
| spellingShingle |
Engineering Signal, Image and Speech Processing Applications of Mathematics Communications Engineering, Networks Aliev, Telman Digital Noise Monitoring of Defect Origin |
| format |
Book |
| author |
Aliev, Telman |
| author_facet |
Aliev, Telman |
| author_sort |
Aliev, Telman |
| title |
Digital Noise Monitoring of Defect Origin |
| title_short |
Digital Noise Monitoring of Defect Origin |
| title_full |
Digital Noise Monitoring of Defect Origin |
| title_fullStr |
Digital Noise Monitoring of Defect Origin |
| title_full_unstemmed |
Digital Noise Monitoring of Defect Origin |
| title_sort |
digital noise monitoring of defect origin |
| publisher |
Springer US |
| publishDate |
2020 |
| url |
http://scholar.dlu.edu.vn/thuvienso/handle/DLU123456789/83917 |
| _version_ |
1757650310325600256 |