Applied Scanning Probe Methods V

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Bibliografische gegevens
Hoofdauteurs:	Bhushan, Bharat, Fuchs, Harald, Kawata, Satoshi
Formaat:	Boek
Taal:	English
Gepubliceerd in:	Springer Berlin Heidelberg 2020
Onderwerpen:	Engineering Nanotechnology and Microengineering Spectroscopy and Microscopy Surface and Interface Science, Thin Films
Online toegang:	https://scholar.dlu.edu.vn/thuvienso/handle/DLU123456789/83934
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Thư viện lưu trữ:	Thư viện Trường Đại học Đà Lạt

id	oai:scholar.dlu.edu.vn:DLU123456789-83934
record_format	dspace
spelling	oai:scholar.dlu.edu.vn:DLU123456789-839342023-10-06T04:04:08Z Applied Scanning Probe Methods V Bhushan, Bharat Fuchs, Harald Kawata, Satoshi Engineering Nanotechnology and Microengineering Spectroscopy and Microscopy Surface and Interface Science, Thin Films 2020-02-24T09:30:16Z 2020-02-24T09:30:16Z 2007 Book 978-3-540-37315-5 978-3-540-37316-2 https://scholar.dlu.edu.vn/thuvienso/handle/DLU123456789/83934 en NanoScience and Technology Springer-Verlag Berlin Heidelberg application/pdf Springer Berlin Heidelberg
institution	Thư viện Trường Đại học Đà Lạt
collection	Thư viện số
language	English
topic	Engineering Nanotechnology and Microengineering Spectroscopy and Microscopy Surface and Interface Science, Thin Films
spellingShingle	Engineering Nanotechnology and Microengineering Spectroscopy and Microscopy Surface and Interface Science, Thin Films Bhushan, Bharat Fuchs, Harald Kawata, Satoshi Applied Scanning Probe Methods V
format	Book
author	Bhushan, Bharat Fuchs, Harald Kawata, Satoshi
author_facet	Bhushan, Bharat Fuchs, Harald Kawata, Satoshi
author_sort	Bhushan, Bharat
title	Applied Scanning Probe Methods V
title_short	Applied Scanning Probe Methods V
title_full	Applied Scanning Probe Methods V
title_fullStr	Applied Scanning Probe Methods V
title_full_unstemmed	Applied Scanning Probe Methods V
title_sort	applied scanning probe methods v
publisher	Springer Berlin Heidelberg
publishDate	2020
url	https://scholar.dlu.edu.vn/thuvienso/handle/DLU123456789/83934
_version_	1819775031602839552

Applied Scanning Probe Methods V

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