Noncontact Atomic Force Microscopy

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Noncontact Atomic Force Microscopy

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Detalles Bibliográficos
Autores principales:	Morita, Seizo, Giessibl, Franz J., Wiesendanger, Roland
Formato:	Libro
Lenguaje:	English
Publicado:	Springer Berlin Heidelberg 2020
Materias:	Engineering Nanotechnology and Microengineering Spectroscopy and Microscopy Theoretical and Applied Mechanics
Acceso en línea:	https://scholar.dlu.edu.vn/thuvienso/handle/DLU123456789/84485
Etiquetas:	Agregar Etiqueta Sin Etiquetas, Sea el primero en etiquetar este registro!

Thư viện lưu trữ:	Thư viện Trường Đại học Đà Lạt

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