Noncontact Atomic Force Microscopy

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Noncontact Atomic Force Microscopy

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Xehetasun bibliografikoak
Egile Nagusiak:	Morita, Seizo, Giessibl, Franz J., Wiesendanger, Roland
Formatua:	Liburua
Hizkuntza:	English
Argitaratua:	Springer Berlin Heidelberg 2020
Gaiak:	Engineering Nanotechnology and Microengineering Spectroscopy and Microscopy Theoretical and Applied Mechanics
Sarrera elektronikoa:	https://scholar.dlu.edu.vn/thuvienso/handle/DLU123456789/84485
Etiketak:	Etiketa erantsi Etiketarik gabe, Izan zaitez lehena erregistro honi etiketa jartzen!

Thư viện lưu trữ:	Thư viện Trường Đại học Đà Lạt

Antzeko izenburuak

Noncontact Atomic Force Microscopy: Volume 3
nork: Morita, S, et al.
Argitaratua: (2016)

Field Emission Scanning Electron Microscopy. 1st ed. 2018
nork: Brodusch, Nicolas, et al.
Argitaratua: (2020)

Micro and Nanomechanics, Volume 5. 1st ed. 2018
nork: Starman, LaVern, et al.
Argitaratua: (2020)

Advanced Noncontact Cutting and Joining Technologies
nork: Mahamood, Rasheedat Modupe, et al.
Argitaratua: (2020)

Advancement of Optical Methods in Experimental Mechanics, Volume 3. 1st ed. 2018
nork: Lamberti, Luciano, et al.
Argitaratua: (2020)

Kelvin Probe Force Microscopy
nork: Sadewasser, Sascha, et al.
Argitaratua: (2020)

Applied Scanning Probe Methods XII
nork: Bhushan, Bharat, et al.
Argitaratua: (2020)

Applied Scanning Probe Methods XI
nork: Bhushan, Bharat, et al.
Argitaratua: (2020)

Applied Scanning Probe Methods XIII
nork: Bhushan, Bharat, et al.
Argitaratua: (2020)

Applied Scanning Probe Methods X
nork: Bhushan, Bharat, et al.
Argitaratua: (2020)

Applied Scanning Probe Methods V
nork: Bhushan, Bharat, et al.
Argitaratua: (2020)

Applied Scanning Probe Methods VIII
nork: Bhushan, Bharat, et al.
Argitaratua: (2020)

Applied Scanning Probe Methods IX
nork: Bhushan, Bharat, et al.
Argitaratua: (2020)

Micro and Nanomechanics, Volume 5
nork: Starman, La Vern, et al.
Argitaratua: (2020)

Mechanical Self-Assembly
nork: Chen, Xi
Argitaratua: (2015)

3rd International Multidisciplinary Microscopy and Microanalysis Congress (InterM). 1st ed. 2017
nork: Oral, Ahmet Yavuz, et al.
Argitaratua: (2020)

The Investigation of Plastic Behavior by Discrete Dislocation Dynamics for Single Crystal Pillar at Submicron Scale
nork: Cui, Yinan
Argitaratua: (2020)

Nanomechanical and Nanoelectromechanical Phenomena in 2D Atomic Crystals. 1st ed. 2018
nork: Kay, Nicholas D.
Argitaratua: (2020)

Specific aptamer-protein interaction studied by atomic force microscopy /

Observation of geometric structure of collagen molecules by atomic force microscopy /
nork: Baranauskas, V.

Applied Scanning Probe Methods VII
nork: Bhushan, Bharat, et al.
Argitaratua: (2020)

IUTAM Symposium on Mechanical Behavior and Micro-Mechanics of Nanostructured Materials
nork: Bai, Y.L., et al.
Argitaratua: (2020)

Advanced Packaging and Manufacturing Technology Based on Adhesion Engineering
nork: Seok, Seonho
Argitaratua: (2020)

Applied Scanning Probe Methods VI
nork: Bhushan, Bharat, et al.
Argitaratua: (2020)

Composites with Micro- and Nano-Structure
nork: Kompiš, Vladimír
Argitaratua: (2020)

Micro and Precision Manufacturing. 1st ed. 2018
nork: Gupta, Kapil
Argitaratua: (2020)

Confocal Raman Microscopy
nork: Toporski, Jan, et al.
Argitaratua: (2020)

Springer Handbook of Microscopy. 1st ed. 2019
nork: Hawkes, Peter W., et al.
Argitaratua: (2020)

Scanning Electron Microscopy and X-Ray Microanalysis. 4th ed.
nork: Goldstein, Joseph I., et al.
Argitaratua: (2020)

Micro and Nanomanufacturing
nork: Jackson, Mark J.
Argitaratua: (2020)

Micro-Manufacturing Technologies and Their Applications
nork: Fassi, Irene, et al.
Argitaratua: (2020)

Commercialization of Nanotechnologies–A Case Study Approach. 1st ed. 2018
nork: Brabazon, Dermot, et al.
Argitaratua: (2020)

Micro and Nanomanufacturing Volume II. 1st ed. 2018
nork: Jackson, Mark J., et al.
Argitaratua: (2020)

Swelling and morphology of the skin layer of polyamide composite membranes : An atomic force microscopy study /
nork: Freger, Viatcheslav.

Mono- and multilayer formation by diazonium reduction on carbon surfaces monitored with atomic force microscopy scratching /
nork: Anariba, Franklin.

Theoretical Atomic Physics. 4th ed. 2017
nork: Friedrich, Harald
Argitaratua: (2020)

The Nanoscale Optical Properties of Complex Nanostructures. 1st ed. 2018
nork: Hachtel, Jordan A.
Argitaratua: (2020)

Synthesis and Characterization of Piezotronic Materials for Application in Strain/Stress Sensing
nork: Zhu, Ren, et al.
Argitaratua: (2020)

Process Variations in Microsystems Manufacturing. 1st ed.
nork: Huff, Michael
Argitaratua: (2020)

Magnetic Nanostructures in Modern Technology
nork: Azzerboni, Bruno, et al.
Argitaratua: (2020)