Functional Verification Coverage Measurement and Analysis

kod QR

Functional Verification Coverage Measurement and Analysis

Zapisane w:

Opis bibliograficzny
1. autor:	Piziali, Andrew
Format:	Książka
Język:	English
Wydane:	Springer US 2020
Hasła przedmiotowe:	Engineering Circuits and Systems Electrical Engineering Computer-Aided Engineering (CAD, CAE) and Design
Dostęp online:	https://scholar.dlu.edu.vn/thuvienso/handle/DLU123456789/84966
Etykiety:	Dodaj etykietę Nie ma etykietki, Dołącz pierwszą etykiete!

Thư viện lưu trữ:	Thư viện Trường Đại học Đà Lạt

Podobne zapisy

Standardized Functional Verification
od: Wiemann, Alan
Wydane: (2020)

Open Verification Methodology Cookbook
od: Glasser, Mark
Wydane: (2020)

Hardware Verification with System Verilog
od: Mintz, Mike, i wsp.
Wydane: (2020)

SystemVerilog for Verification
od: Spear, Chris
Wydane: (2020)

Functional Design Errors in Digital Circuits
od: Chang, Kai-hui, i wsp.
Wydane: (2020)

Timing Optimization Through Clock Skew Scheduling
od: Kourtev, Ivan S., i wsp.
Wydane: (2020)

Clocking in Modern VLSI Systems
od: Xanthopoulos, Thucydides
Wydane: (2020)

Creating Assertion-Based IP
od: Foster, Harry D., i wsp.
Wydane: (2020)

Assertion-Based Design
od: Foster, Harry D., i wsp.
Wydane: (2020)

Digital Design and Implementation with Field Programmable Devices
od: Navabi, Zainalabedin
Wydane: (2020)

The Universal Generating Function in Reliability Analysis and Optimization
od: Levitin, Gregory
Wydane: (2020)

Routing Congestion in VLSI Circuits
od: Saxena, Prashant, i wsp.
Wydane: (2020)

Rapid Prototyping of Digital Systems
od: Hamblen, James O., i wsp.
Wydane: (2020)

Embedded System Design
od: Gajski, Daniel D., i wsp.
Wydane: (2020)

Automated Technology for Verification and Analysis
od: Peled, Doron A., i wsp.
Wydane: (2020)

Automated Technology for Verification and Analysis
od: Namjoshi, Kedar, i wsp.
Wydane: (2020)

Nanosystems Design and Technology
od: DeMicheli, Giovanni, i wsp.
Wydane: (2020)

Full-Chip Nanometer Routing Techniques
od: Ho, Tsung-Yi, i wsp.
Wydane: (2020)

Static Timing Analysis for Nanometer Designs
od: Bhasker, J., i wsp.
Wydane: (2020)

Verilog and SystemVerilog Gotchas
od: Sutherland, Stuart, i wsp.
Wydane: (2020)

Global Specification and Validation of Embedded Systems
od: Nicolescu, G., i wsp.
Wydane: (2020)

CMOS Active Inductors and Transformers
od: Yuan, Fei
Wydane: (2020)

Closing the Power Gap between ASIC & Custom
od: Chinnery, David, i wsp.
Wydane: (2020)

Inverse Problems in Electric Circuits and Electromagnetics
od: Korovkin, N.V., i wsp.
Wydane: (2020)

Design of Embedded Control Systems
od: Adamski, Marian Andrzej, i wsp.
Wydane: (2020)

Design for Manufacturability and Statistical Design
od: Orshansky, Michael, i wsp.
Wydane: (2020)

Solid Modeling and Applications
od: Um, Dugan
Wydane: (2020)

Models for Computer Aided Tolerancing in Design and Manufacturing
od: Davidson, Joseph K.
Wydane: (2020)

Millimeter-Wave Low Noise Amplifiers. 1st ed. 2018
od: Božanić, Mladen, i wsp.
Wydane: (2020)

Design for Manufacturability and Yield for Nano-Scale CMOS
od: Chiang, Charles, i wsp.
Wydane: (2020)

CMOS Current-Mode Circuits for Data Communications
od: Yuan, Fei
Wydane: (2020)

Nanometer Technology Designs
od: Ahmed, Nisar
Wydane: (2020)

Low-Power High-Level Synthesis for Nanoscale CMOS Circuits
od: Mohanty, Saraju P., i wsp.
Wydane: (2020)

Carbon Nanotube Electronics
od: Javey, Ali, i wsp.
Wydane: (2020)

Advances in Ergonomics of Manufacturing: Managing the Enterprise of the Future. 1st ed. 2018
od: Trzcielinski, Stefan
Wydane: (2020)

Computational Morphologies. 1st ed. 2018
od: Rossi, Michela, i wsp.
Wydane: (2020)

Inhibitory Rules in Data Analysis
Wydane: (2020)

Designing Inclusive Futures
od: Langdon, P., i wsp.
Wydane: (2020)

Rough Set Theory: A True Landmark in Data Analysis
Wydane: (2020)

Collaborative Design and Planning for Digital Manufacturing
od: Wang, Lihui, i wsp.
Wydane: (2020)