Transmission Electron Microscopy. 2nd ed.

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Transmission Electron Microscopy. 2nd ed.

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Xehetasun bibliografikoak
Egile Nagusiak:	Williams, David B., Carter, C. Barry
Formatua:	Liburua
Hizkuntza:	English
Argitaratua:	Springer US 2020
Gaiak:	Materials Science Characterization and Evaluation of Materials Nanotechnology Solid State Physics
Sarrera elektronikoa:	https://scholar.dlu.edu.vn/thuvienso/handle/DLU123456789/93826
Etiketak:	Etiketa erantsi Etiketarik gabe, Izan zaitez lehena erregistro honi etiketa jartzen!

Thư viện lưu trữ:	Thư viện Trường Đại học Đà Lạt

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