Transmission Electron Microscopy. 2nd ed.
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Auteurs principaux: | Williams, David B., Carter, C. Barry |
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Format: | Livre |
Langue: | English |
Publié: |
Springer US
2020
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Sujets: | |
Accès en ligne: | https://scholar.dlu.edu.vn/thuvienso/handle/DLU123456789/93826 |
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Thư viện lưu trữ: | Thư viện Trường Đại học Đà Lạt |
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