Epioptics - 7 : proceedings of the 24th course of the International School of Solid State Physics: Erice, Italy, 20-26 July 2002
This book assesses the capabilities of state-of-the-art optical techniques in elucidating the fundamental electronic and structural properties of semiconductor and metal surfaces, interfaces, thin layers, and layer structures. It also examines the usefulness of these techniques for optimization of h...
Đã lưu trong:
| Định dạng: | Sách |
|---|---|
| Ngôn ngữ: | Undetermined |
| Được phát hành: |
River Edge, N.J.
World Scientific
2004
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| Những chủ đề: | |
| Các nhãn: |
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| Thư viện lưu trữ: | Trung tâm Học liệu Trường Đại học Cần Thơ |
|---|
| LEADER | 01537nam a2200217Ia 4500 | ||
|---|---|---|---|
| 001 | CTU_156179 | ||
| 008 | 210402s9999 xx 000 0 und d | ||
| 020 | |c 92 | ||
| 082 | |a 537.6 | ||
| 082 | |b E64 | ||
| 245 | 0 | |a Epioptics - 7 : | |
| 245 | 0 | |b proceedings of the 24th course of the International School of Solid State Physics: Erice, Italy, 20-26 July 2002 | |
| 245 | 0 | |c Editor, Antonio Cricenti. | |
| 260 | |a River Edge, N.J. | ||
| 260 | |b World Scientific | ||
| 260 | |c 2004 | ||
| 520 | |a This book assesses the capabilities of state-of-the-art optical techniques in elucidating the fundamental electronic and structural properties of semiconductor and metal surfaces, interfaces, thin layers, and layer structures. It also examines the usefulness of these techniques for optimization of high quality multilayer samples through feedback control during materials growth and processing. Emphasis is given to dynamical processes through the use of pump–probe techniques, together with the search for new optical sources. Some new applications of scanning probe microscopy to materials science and biological samples (dried and in vivo) with the use of different laser sources are also presented. | ||
| 650 | |a Semiconductors,Surfaces (Physics),Spectrum analysis,Chất bán dẫn,Bề mặt ( vật lý ),Phân tích quang phổ | ||
| 650 | |x Surfaces,Optical properties,Optical properties,Bề mặt,Đặc tính quang học | ||
| 904 | |i QHieu | ||
| 980 | |a Trung tâm Học liệu Trường Đại học Cần Thơ | ||