Real-time PCB monitoring using time-of-flight mass spectrometry with picosecond laser ionization /

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Real-time PCB monitoring using time-of-flight mass spectrometry with picosecond laser ionization /

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Opis bibliograficzny
Kolejni autorzy:	Deguchi, Yoshihiro., Dobashi, Shinsaku., Fukuda, Norihiro., Morita, Masatoshi., Shinoda, Katsuhiko.
Format:	Artykuł
Język:	English
Hasła przedmiotowe:	Chemical analysis Heat treatment Laser irradiation Multiphoton ionization Picosecond Pollution Sensitivity Thermal degradation
Etykiety:	Dodaj etykietę Nie ma etykietki, Dołącz pierwszą etykiete!

Thư viện lưu trữ:	Thư viện Trường Đại học Đà Lạt

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