Quantitative elemental analysis for rhodium and palladium in minerals by time-of-flight resonance ionization mass spectrometry /

Documents similaires

• Resonance ionization spectroscopy 2000 : laser ionization and applications incorporating RIS, 10th international symposium, Knoxville, Tennessee, 8-12 October 2000 /
  Publié: (2001)
• Resonance ionization spectroscopy 2000 : laser ionization and applications incorporating RIS, 10th international symposium, Knoxville, Tennessee, 8-12 October 2000 /
  Publié: (2001)
• Application of femtosecond laser ablation time-of-flight mass spectrometry to in-depth multilayer analysis /
  par: Margetic, Vanja.
• Desorption/ionization on silicon time-of-flight/time-of-flight mass spectrometry /
• Quantitative analysis of synthetic polymers using matrix-assisted laser desorption/ionization time-of-flight mass spectrometry /