Quantitative elemental analysis for rhodium and palladium in minerals by time-of-flight resonance ionization mass spectrometry /
Sparad:
| Huvudupphovsman: | Dimov, S. S. |
|---|---|
| Övriga upphovsmän: | Chryssoulis, S. L., Lipson, R. H. |
| Materialtyp: | Artikel |
| Språk: | English |
| Ämnen: | |
| Taggar: |
Lägg till en tagg
Inga taggar, Lägg till första taggen!
|
| Thư viện lưu trữ: | Thư viện Trường Đại học Đà Lạt |
|---|
Liknande verk
-
Resonance ionization spectroscopy 2000 : laser ionization and applications incorporating RIS, 10th international symposium, Knoxville, Tennessee, 8-12 October 2000 /
Publicerad: (2001) -
Resonance ionization spectroscopy 2000 : laser ionization and applications incorporating RIS, 10th international symposium, Knoxville, Tennessee, 8-12 October 2000 /
Publicerad: (2001) - Desorption/ionization on silicon time-of-flight/time-of-flight mass spectrometry /
-
Application of femtosecond laser ablation time-of-flight mass spectrometry to in-depth multilayer analysis /
av: Margetic, Vanja. - Quantitative analysis of synthetic polymers using matrix-assisted laser desorption/ionization time-of-flight mass spectrometry /