Quantitative elemental analysis for rhodium and palladium in minerals by time-of-flight resonance ionization mass spectrometry /
Wedi'i Gadw mewn:
| Prif Awdur: | Dimov, S. S. |
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| Awduron Eraill: | Chryssoulis, S. L., Lipson, R. H. |
| Fformat: | Erthygl |
| Iaith: | English |
| Pynciau: | |
| Tagiau: |
Ychwanegu Tag
Dim Tagiau, Byddwch y cyntaf i dagio'r cofnod hwn!
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| Thư viện lưu trữ: | Thư viện Trường Đại học Đà Lạt |
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Eitemau Tebyg
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Resonance ionization spectroscopy 2000 : laser ionization and applications incorporating RIS, 10th international symposium, Knoxville, Tennessee, 8-12 October 2000 /
Cyhoeddwyd: (2001) -
Resonance ionization spectroscopy 2000 : laser ionization and applications incorporating RIS, 10th international symposium, Knoxville, Tennessee, 8-12 October 2000 /
Cyhoeddwyd: (2001) -
Application of femtosecond laser ablation time-of-flight mass spectrometry to in-depth multilayer analysis /
gan: Margetic, Vanja. - Desorption/ionization on silicon time-of-flight/time-of-flight mass spectrometry /
- Quantitative analysis of synthetic polymers using matrix-assisted laser desorption/ionization time-of-flight mass spectrometry /