Quantitative elemental analysis for rhodium and palladium in minerals by time-of-flight resonance ionization mass spectrometry /
שמור ב:
| מחבר ראשי: | Dimov, S. S. |
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| מחברים אחרים: | Chryssoulis, S. L., Lipson, R. H. |
| פורמט: | Bài viết |
| שפה: | English |
| נושאים: | |
| תגים: |
הוספת תג
אין תגיות, היה/י הראשונ/ה לתייג את הרשומה!
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| Thư viện lưu trữ: | Thư viện Trường Đại học Đà Lạt |
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פריטים דומים
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Resonance ionization spectroscopy 2000 : laser ionization and applications incorporating RIS, 10th international symposium, Knoxville, Tennessee, 8-12 October 2000 /
יצא לאור: (2001) -
Resonance ionization spectroscopy 2000 : laser ionization and applications incorporating RIS, 10th international symposium, Knoxville, Tennessee, 8-12 October 2000 /
יצא לאור: (2001) - Desorption/ionization on silicon time-of-flight/time-of-flight mass spectrometry /
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Application of femtosecond laser ablation time-of-flight mass spectrometry to in-depth multilayer analysis /
מאת: Margetic, Vanja. - Quantitative analysis of synthetic polymers using matrix-assisted laser desorption/ionization time-of-flight mass spectrometry /