Quantitative elemental analysis for rhodium and palladium in minerals by time-of-flight resonance ionization mass spectrometry /
Gorde:
| Egile nagusia: | Dimov, S. S. |
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| Beste egile batzuk: | Chryssoulis, S. L., Lipson, R. H. |
| Formatua: | Artikulua |
| Hizkuntza: | English |
| Gaiak: | |
| Etiketak: |
Etiketa erantsi
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| Thư viện lưu trữ: | Thư viện Trường Đại học Đà Lạt |
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Antzeko izenburuak
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Resonance ionization spectroscopy 2000 : laser ionization and applications incorporating RIS, 10th international symposium, Knoxville, Tennessee, 8-12 October 2000 /
Argitaratua: (2001) -
Resonance ionization spectroscopy 2000 : laser ionization and applications incorporating RIS, 10th international symposium, Knoxville, Tennessee, 8-12 October 2000 /
Argitaratua: (2001) -
Application of femtosecond laser ablation time-of-flight mass spectrometry to in-depth multilayer analysis /
nork: Margetic, Vanja. - Desorption/ionization on silicon time-of-flight/time-of-flight mass spectrometry /
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