Differential charging in X-ray photoelectron spectroscopy : A nuisance or a useful tool ? /

Samankaltaisia teoksia

• Quantitative X-ray photoelectron spectroscopy and time-of-flight secondary ion mass spectrometry characterization of the components in DNA /
  Tekijä: May, Collin J.
• Characterization of carbon/nitroazobenzene/titanium molecular electronic junctions with photoelectron and raman spectroscopy /
  Tekijä: Nowak, Aletha M.
• O-phenylenediamine electropolymerization by cyclic voltammetry combined with electrospray ionization-ion trap mass spectrometry /
  Tekijä: Losito, Ilario.
• Spectroscopic and diffraction study of uranium speciation in contaminated vadose zone sediments from the Hanford site, Washington State /
• Introduction to X-ray spectrometric analysis
  Tekijä: Bertin, Eugene P
  Julkaistu: (2013)