Differential charging in X-ray photoelectron spectroscopy : A nuisance or a useful tool ? /

Παρόμοια τεκμήρια

• Quantitative X-ray photoelectron spectroscopy and time-of-flight secondary ion mass spectrometry characterization of the components in DNA /
  ανά: May, Collin J.
• Characterization of carbon/nitroazobenzene/titanium molecular electronic junctions with photoelectron and raman spectroscopy /
  ανά: Nowak, Aletha M.
• O-phenylenediamine electropolymerization by cyclic voltammetry combined with electrospray ionization-ion trap mass spectrometry /
  ανά: Losito, Ilario.
• Spectroscopic and diffraction study of uranium speciation in contaminated vadose zone sediments from the Hanford site, Washington State /
• Introduction to X-ray spectrometric analysis
  ανά: Bertin, Eugene P
  Έκδοση: (2013)