Microstructure study of electrochemically driven LixSi /

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Altres autors:	Cho, Jong Soo., DeLuca, Christopher M., Dunn, Martin L., Han, Heung Nam., Kim, Kee-Bum., Kim, Sung-Hwan., Lee, Se-Hee., Maute, Kurt K., Moon, Jeong-Tak., Oh, Kyu Hwan., Roh, Hyunchul., Son, Seoung-Bum., Trevey, James E.
Format:	Article
Idioma:	English
Matèries:	Chemomechanical modeling Focused ion beam High resolution transmission electron microscopy Silicon anode X-ray diffraction
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Thư viện lưu trữ:	Thư viện Trường Đại học Đà Lạt

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