Multi-Scale Characterization of Crystalline Properties in Thick AlN Epitaxial Films Grown on Trench-Patterned Templates

Chapter 1. Introduction; Chapter 2. Cross-sectional X-ray microdiffraction study of thick AlN films grown on trench-patterned AlN/α-Al2O3 templates; Chapter. 3Simulation of residual strain in thick AlN films grown on trenchpatterned AlN/a-Al2O3 templates using the finite element method; ...

में बचाया:
ग्रंथसूची विवरण
मुख्य लेखक: Dinh Thanh Khan
भाषा:eng
प्रकाशित: Osaka University,
ऑनलाइन पहुंच:https://dlib.udn.vn/module/chi-tiet-sach?RecordID=2767
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