Contactless VLSI Measurement and Testing Techniques. 1st ed. 2018

Đã lưu trong:

Chi tiết về thư mục
Tác giả chính:	Sayil, Selahattin
Định dạng:	Sách
Ngôn ngữ:	English
Được phát hành:	Springer International Publishing 2020
Những chủ đề:	Engineering Circuits and Systems Processor Architectures Electronics and Microelectronics, Instrumentation
Truy cập trực tuyến:	http://doi.org/10.1007/978-3-319-69673-7 https://scholar.dlu.edu.vn/thuvienso/handle/DLU123456789/101362
Các nhãn:	Thêm thẻ Không có thẻ, Là người đầu tiên thẻ bản ghi này!

Thư viện lưu trữ:	Thư viện Trường Đại học Đà Lạt

id	oai:scholar.dlu.edu.vn:DLU123456789-101362
record_format	dspace
spelling	oai:scholar.dlu.edu.vn:DLU123456789-1013622023-10-06T21:46:17Z Contactless VLSI Measurement and Testing Techniques. 1st ed. 2018 Sayil, Selahattin Engineering Circuits and Systems Processor Architectures Electronics and Microelectronics, Instrumentation 2020-09-11T10:13:36Z 2020-09-11T10:13:36Z 2018 Book 978-3-319-69672-0 978-3-319-69673-7 http://doi.org/10.1007/978-3-319-69673-7 https://scholar.dlu.edu.vn/thuvienso/handle/DLU123456789/101362 en Springer International Publishing AG application/pdf Springer International Publishing
institution	Thư viện Trường Đại học Đà Lạt
collection	Thư viện số
language	English
topic	Engineering Circuits and Systems Processor Architectures Electronics and Microelectronics, Instrumentation
spellingShingle	Engineering Circuits and Systems Processor Architectures Electronics and Microelectronics, Instrumentation Sayil, Selahattin Contactless VLSI Measurement and Testing Techniques. 1st ed. 2018
format	Book
author	Sayil, Selahattin
author_facet	Sayil, Selahattin
author_sort	Sayil, Selahattin
title	Contactless VLSI Measurement and Testing Techniques. 1st ed. 2018
title_short	Contactless VLSI Measurement and Testing Techniques. 1st ed. 2018
title_full	Contactless VLSI Measurement and Testing Techniques. 1st ed. 2018
title_fullStr	Contactless VLSI Measurement and Testing Techniques. 1st ed. 2018
title_full_unstemmed	Contactless VLSI Measurement and Testing Techniques. 1st ed. 2018
title_sort	contactless vlsi measurement and testing techniques. 1st ed. 2018
publisher	Springer International Publishing
publishDate	2020
url	http://doi.org/10.1007/978-3-319-69673-7 https://scholar.dlu.edu.vn/thuvienso/handle/DLU123456789/101362
_version_	1779413669159895040

Contactless VLSI Measurement and Testing Techniques. 1st ed. 2018

Những quyển sách tương tự