Resonant X-Ray Scattering in Correlated Systems. 1st ed. 2017
Đã lưu trong:
Những tác giả chính: | Murakami, Youichi, Ishihara, Sumio |
---|---|
Formáid: | Leabhar |
Teanga: | English |
Foilsithe: |
Springer Berlin Heidelberg
2020
|
Ábhair: | |
Rochtain Ar Líne: | http://doi.org/10.1007/978-3-662-53227-0 https://scholar.dlu.edu.vn/thuvienso/handle/DLU123456789/101955 |
Clibeanna: |
Cuir Clib Leis
Gan Chlibeanna, Bí ar an gcéad duine leis an taifead seo a chlibeáil!
|
Thư viện lưu trữ: | Thư viện Trường Đại học Đà Lạt |
---|
Míreanna Comhchosúla
-
Nanoscale AFM and TEM Observations of Elementary Dislocation Mechanisms. 1st ed. 2017
le: Veselý, Jozef
Foilsithe: (2020) -
Magnetic Resonance of Semiconductors and Their Nanostructures. 1st ed. 2017
le: Baranov, Pavel G., et al.
Foilsithe: (2020) -
Scanning Electron Microscopy and X-Ray Microanalysis. 4th ed.
le: Goldstein, Joseph I., et al.
Foilsithe: (2020) -
Designing of Elastomer Nanocomposites: From Theory to Applications. 1st ed. 2017
le: Stöckelhuber, Klaus Werner, et al.
Foilsithe: (2020) -
Solid-State Physics. 4th ed.
le: Ibach, Harald, et al.
Foilsithe: (2020)