Field Emission Scanning Electron Microscopy. 1st ed. 2018

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Field Emission Scanning Electron Microscopy. 1st ed. 2018

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Главные авторы:	Brodusch, Nicolas, Demers, Hendrix, Gauvin, Raynald
Формат:	‌
Язык:	English
Опубликовано:	Springer Singapore 2020
Предметы:	Materials Science Characterization and Evaluation of Materials Spectroscopy and Microscopy Nanotechnology and Microengineering
Online-ссылка:	http://doi.org/10.1007/978-981-10-4433-5 https://scholar.dlu.edu.vn/thuvienso/handle/DLU123456789/102700
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Thư viện lưu trữ:	Thư viện Trường Đại học Đà Lạt

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