Testing Complex and Embedded Systems

Presenting combinatorial approaches for improving test coverage, Testing Complex and Embedded Systems details techniques to help you streamline testing and identify problems before they occur—including turbocharged testing using Six Sigma and exploratory testing methods. Rather than present the cont...

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Những tác giả chính:	Pries, Kim H., Quigley, Jon M.
Định dạng:	Sách
Ngôn ngữ:	English
Được phát hành:	CRC Press 2012
Những chủ đề:	Engineering
Truy cập trực tuyến:	http://scholar.dlu.edu.vn/thuvienso/handle/DLU123456789/30141
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spelling	oai:scholar.dlu.edu.vn:DLU123456789-301412012-03-11T09:30:17Z Testing Complex and Embedded Systems Pries, Kim H. Quigley, Jon M. Engineering Presenting combinatorial approaches for improving test coverage, Testing Complex and Embedded Systems details techniques to help you streamline testing and identify problems before they occur—including turbocharged testing using Six Sigma and exploratory testing methods. Rather than present the continuum of testing for particular products or design attributes, the text focuses on boundary conditions. Examining systems and software testing, it explains how to use simulation and emulation to complement testing 2012-03-07T02:54:58Z 2012-03-07T02:54:58Z 2010 Book 9781439821404 http://scholar.dlu.edu.vn/thuvienso/handle/DLU123456789/30141 en application/pdf CRC Press
institution	Thư viện Trường Đại học Đà Lạt
collection	Thư viện số
language	English
topic	Engineering
spellingShingle	Engineering Pries, Kim H. Quigley, Jon M. Testing Complex and Embedded Systems
description	Presenting combinatorial approaches for improving test coverage, Testing Complex and Embedded Systems details techniques to help you streamline testing and identify problems before they occur—including turbocharged testing using Six Sigma and exploratory testing methods. Rather than present the continuum of testing for particular products or design attributes, the text focuses on boundary conditions. Examining systems and software testing, it explains how to use simulation and emulation to complement testing
format	Book
author	Pries, Kim H. Quigley, Jon M.
author_facet	Pries, Kim H. Quigley, Jon M.
author_sort	Pries, Kim H.
title	Testing Complex and Embedded Systems
title_short	Testing Complex and Embedded Systems
title_full	Testing Complex and Embedded Systems
title_fullStr	Testing Complex and Embedded Systems
title_full_unstemmed	Testing Complex and Embedded Systems
title_sort	testing complex and embedded systems
publisher	CRC Press
publishDate	2012
url	http://scholar.dlu.edu.vn/thuvienso/handle/DLU123456789/30141
_version_	1757674228997423104

Testing Complex and Embedded Systems

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