Electromigration Modeling at Circuit Layout Level
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| Những tác giả chính: | , |
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| Định dạng: | Sách |
| Ngôn ngữ: | English |
| Được phát hành: |
Springer Singapore
2015
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| Những chủ đề: | |
| Truy cập trực tuyến: | https://scholar.dlu.edu.vn/thuvienso/handle/DLU123456789/40677 |
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| Thư viện lưu trữ: | Thư viện Trường Đại học Đà Lạt |
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oai:scholar.dlu.edu.vn:DLU123456789-40677 |
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oai:scholar.dlu.edu.vn:DLU123456789-406772023-11-11T05:12:44Z Electromigration Modeling at Circuit Layout Level Tan, Cher Ming He, Feifei Quality Control, Reliability, Safety and Risk Electronic Circuits and Devices 2015-01-08T03:20:39Z 2015-01-08T03:20:39Z 2013 Book 978-981-4451-20-8 978-981-4451-21-5 https://scholar.dlu.edu.vn/thuvienso/handle/DLU123456789/40677 en application/pdf Springer Singapore |
| institution |
Thư viện Trường Đại học Đà Lạt |
| collection |
Thư viện số |
| language |
English |
| topic |
Quality Control, Reliability, Safety and Risk Electronic Circuits and Devices |
| spellingShingle |
Quality Control, Reliability, Safety and Risk Electronic Circuits and Devices Tan, Cher Ming He, Feifei Electromigration Modeling at Circuit Layout Level |
| format |
Book |
| author |
Tan, Cher Ming He, Feifei |
| author_facet |
Tan, Cher Ming He, Feifei |
| author_sort |
Tan, Cher Ming |
| title |
Electromigration Modeling at Circuit Layout Level |
| title_short |
Electromigration Modeling at Circuit Layout Level |
| title_full |
Electromigration Modeling at Circuit Layout Level |
| title_fullStr |
Electromigration Modeling at Circuit Layout Level |
| title_full_unstemmed |
Electromigration Modeling at Circuit Layout Level |
| title_sort |
electromigration modeling at circuit layout level |
| publisher |
Springer Singapore |
| publishDate |
2015 |
| url |
https://scholar.dlu.edu.vn/thuvienso/handle/DLU123456789/40677 |
| _version_ |
1782541381708808192 |