CMOS Test and Evaluation: A Physical Perspective
CMOS Test and Evaluation: A Physical Perspective is a single source for an integrated view of test and data analysis methodology for CMOS products, covering circuit sensitivities to MOSFET characteristics, impact of silicon technology process variability, applications of embedded test structures and...
Đã lưu trong:
| Những tác giả chính: | , |
|---|---|
| Định dạng: | Sách |
| Ngôn ngữ: | English |
| Được phát hành: |
Springer
2016
|
| Những chủ đề: | |
| Truy cập trực tuyến: | https://scholar.dlu.edu.vn/thuvienso/handle/DLU123456789/59909 |
| Các nhãn: |
Thêm thẻ
Không có thẻ, Là người đầu tiên thẻ bản ghi này!
|
| Thư viện lưu trữ: | Thư viện Trường Đại học Đà Lạt |
|---|
| id |
oai:scholar.dlu.edu.vn:DLU123456789-59909 |
|---|---|
| record_format |
dspace |
| spelling |
oai:scholar.dlu.edu.vn:DLU123456789-599092023-11-11T06:56:25Z CMOS Test and Evaluation: A Physical Perspective Bhushan, Manjul Ketchen, Mark B Systems engineering Electronics System safety CMOS Test and Evaluation: A Physical Perspective is a single source for an integrated view of test and data analysis methodology for CMOS products, covering circuit sensitivities to MOSFET characteristics, impact of silicon technology process variability, applications of embedded test structures and sensors, product yield, and reliability over the lifetime of the product. This book also covers statistical data analysis and visualization techniques, test equipment and CMOS product specifications, and examines product behavior over its full voltage, temperature and frequency range. 2016-03-28T07:28:09Z 2016-03-28T07:28:09Z 2015 Book 978-1-4939-1349-7 978-1-4939-1348-0 https://scholar.dlu.edu.vn/thuvienso/handle/DLU123456789/59909 en application/pdf Springer |
| institution |
Thư viện Trường Đại học Đà Lạt |
| collection |
Thư viện số |
| language |
English |
| topic |
Systems engineering Electronics System safety |
| spellingShingle |
Systems engineering Electronics System safety Bhushan, Manjul Ketchen, Mark B CMOS Test and Evaluation: A Physical Perspective |
| description |
CMOS Test and Evaluation: A Physical Perspective is a single source for an integrated view of test and data analysis methodology for CMOS products, covering circuit sensitivities to MOSFET characteristics, impact of silicon technology process variability, applications of embedded test structures and sensors, product yield, and reliability over the lifetime of the product. This book also covers statistical data analysis and visualization techniques, test equipment and CMOS product specifications, and examines product behavior over its full voltage, temperature and frequency range. |
| format |
Book |
| author |
Bhushan, Manjul Ketchen, Mark B |
| author_facet |
Bhushan, Manjul Ketchen, Mark B |
| author_sort |
Bhushan, Manjul |
| title |
CMOS Test and Evaluation:
A Physical Perspective |
| title_short |
CMOS Test and Evaluation:
A Physical Perspective |
| title_full |
CMOS Test and Evaluation:
A Physical Perspective |
| title_fullStr |
CMOS Test and Evaluation:
A Physical Perspective |
| title_full_unstemmed |
CMOS Test and Evaluation:
A Physical Perspective |
| title_sort |
cmos test and evaluation:
a physical perspective |
| publisher |
Springer |
| publishDate |
2016 |
| url |
https://scholar.dlu.edu.vn/thuvienso/handle/DLU123456789/59909 |
| _version_ |
1782532429122109440 |