Hot Carrier Degradation in Semiconductor Devices
This book provides readers with a variety of tools to address the challenges posed by hot carrier degradation, one of today’s most complicated reliability issues in semiconductor devices. Coverage includes an explanation of carrier transport within devices and book-keeping of how they acquire energ...
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| Ngôn ngữ: | English |
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Springer
2016
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oai:scholar.dlu.edu.vn:DLU123456789-599342023-11-11T06:54:49Z Hot Carrier Degradation in Semiconductor Devices Grasser, Tibor Electricity Physics Science Semiconductors Hot carriers This book provides readers with a variety of tools to address the challenges posed by hot carrier degradation, one of today’s most complicated reliability issues in semiconductor devices. Coverage includes an explanation of carrier transport within devices and book-keeping of how they acquire energy (“become hot”), interaction of an ensemble of colder and hotter carriers with defect precursors, which eventually leads to the creation of a defect, and a description of how these defects interact with the device, degrading its performance. 2016-03-29T07:19:21Z 2016-03-29T07:19:21Z 2015 Book 978-3-319-08994-2 978-3-319-08993-5 https://scholar.dlu.edu.vn/thuvienso/handle/DLU123456789/59934 en application/pdf Springer |
| institution |
Thư viện Trường Đại học Đà Lạt |
| collection |
Thư viện số |
| language |
English |
| topic |
Electricity Physics Science Semiconductors Hot carriers |
| spellingShingle |
Electricity Physics Science Semiconductors Hot carriers Grasser, Tibor Hot Carrier Degradation in Semiconductor Devices |
| description |
This book provides readers with a variety of tools to address the challenges posed by hot carrier degradation, one of today’s most complicated reliability issues in semiconductor devices. Coverage includes an explanation of carrier transport within devices and book-keeping of how they acquire energy (“become hot”), interaction of an ensemble of colder and hotter carriers with defect precursors, which eventually leads to the creation of a defect, and a description of how these defects interact with the device, degrading its performance. |
| format |
Book |
| author |
Grasser, Tibor |
| author_facet |
Grasser, Tibor |
| author_sort |
Grasser, Tibor |
| title |
Hot Carrier Degradation in Semiconductor Devices |
| title_short |
Hot Carrier Degradation in Semiconductor Devices |
| title_full |
Hot Carrier Degradation in Semiconductor Devices |
| title_fullStr |
Hot Carrier Degradation in Semiconductor Devices |
| title_full_unstemmed |
Hot Carrier Degradation in Semiconductor Devices |
| title_sort |
hot carrier degradation in semiconductor devices |
| publisher |
Springer |
| publishDate |
2016 |
| url |
https://scholar.dlu.edu.vn/thuvienso/handle/DLU123456789/59934 |
| _version_ |
1782545324197281792 |