Hot Carrier Degradation in Semiconductor Devices
This book provides readers with a variety of tools to address the challenges posed by hot carrier degradation, one of today’s most complicated reliability issues in semiconductor devices. Coverage includes an explanation of carrier transport within devices and book-keeping of how they acquire energ...
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| 第一著者: | |
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| フォーマット: | 図書 |
| 言語: | English |
| 出版事項: |
Springer
2016
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| 主題: | |
| オンライン･アクセス: | https://scholar.dlu.edu.vn/thuvienso/handle/DLU123456789/59934 |
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| Thư viện lưu trữ: | Thư viện Trường Đại học Đà Lạt |
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