Noncontact Atomic Force Microscopy
Guardat en:
Autors principals: | Morita, Seizo, Giessibl, Franz J., Wiesendanger, Roland |
---|---|
Format: | Llibre |
Idioma: | English |
Publicat: |
Springer Berlin Heidelberg
2020
|
Matèries: | |
Accés en línia: | https://scholar.dlu.edu.vn/thuvienso/handle/DLU123456789/84485 |
Etiquetes: |
Afegir etiqueta
Sense etiquetes, Sigues el primer a etiquetar aquest registre!
|
Thư viện lưu trữ: | Thư viện Trường Đại học Đà Lạt |
---|
Ítems similars
-
Noncontact Atomic Force Microscopy:
Volume 3
per: Morita, S, et al.
Publicat: (2016) -
Field Emission Scanning Electron Microscopy. 1st ed. 2018
per: Brodusch, Nicolas, et al.
Publicat: (2020) -
Micro and Nanomechanics, Volume 5. 1st ed. 2018
per: Starman, LaVern, et al.
Publicat: (2020) -
Advanced Noncontact Cutting and Joining Technologies
per: Mahamood, Rasheedat Modupe, et al.
Publicat: (2020) -
Advancement of Optical Methods in Experimental Mechanics, Volume 3. 1st ed. 2018
per: Lamberti, Luciano, et al.
Publicat: (2020)