Yield-Aware Analog IC Design and Optimization in Nanometer-scale Technologies. 1st ed.

समान संसाधन

• Automatic Analog IC Sizing and Optimization Constrained with PVT Corners and Layout Effects
  द्वारा: Lourenço, Nuno, और अन्य
  प्रकाशित: (2020)
• Analog Integrated Circuit Design Automation
  द्वारा: Martins, Ricardo, और अन्य
  प्रकाशित: (2020)
• Nanometer CMOS ICs
  द्वारा: Veendrick, Harry J.M.
  प्रकाशित: (2020)
• Design for Manufacturability and Yield for Nano-Scale CMOS
  द्वारा: Chiang, Charles, और अन्य
  प्रकाशित: (2020)
• Data Mining and Diagnosing IC Fails
  द्वारा: Huisman, Leendert M.
  प्रकाशित: (2020)