Scanning Electron Microscopy and X-Ray Microanalysis. 4th ed.
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| Những tác giả chính: | , , , , , |
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| Định dạng: | Sách |
| Ngôn ngữ: | English |
| Được phát hành: |
Springer New York
2020
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| Truy cập trực tuyến: | https://scholar.dlu.edu.vn/thuvienso/handle/DLU123456789/94200 |
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oai:scholar.dlu.edu.vn:DLU123456789-942002023-10-06T12:23:03Z Scanning Electron Microscopy and X-Ray Microanalysis. 4th ed. Goldstein, Joseph I. Newbury, Dale E. Michael, Joseph R. Ritchie, Nicholas W.M. Scott, John Henry J. Joy, David C. Materials Science Characterization and Evaluation of Materials Spectroscopy and Microscopy Biological Microscopy 2020-08-18T07:50:11Z 2020-08-18T07:50:11Z 2018 Book 978-1-4939-6674-5 978-1-4939-6676-9 https://scholar.dlu.edu.vn/thuvienso/handle/DLU123456789/94200 en Springer Science+Business Media LLC application/pdf Springer New York |
| institution |
Thư viện Trường Đại học Đà Lạt |
| collection |
Thư viện số |
| language |
English |
| topic |
Materials Science Characterization and Evaluation of Materials Spectroscopy and Microscopy Biological Microscopy |
| spellingShingle |
Materials Science Characterization and Evaluation of Materials Spectroscopy and Microscopy Biological Microscopy Goldstein, Joseph I. Newbury, Dale E. Michael, Joseph R. Ritchie, Nicholas W.M. Scott, John Henry J. Joy, David C. Scanning Electron Microscopy and X-Ray Microanalysis. 4th ed. |
| format |
Book |
| author |
Goldstein, Joseph I. Newbury, Dale E. Michael, Joseph R. Ritchie, Nicholas W.M. Scott, John Henry J. Joy, David C. |
| author_facet |
Goldstein, Joseph I. Newbury, Dale E. Michael, Joseph R. Ritchie, Nicholas W.M. Scott, John Henry J. Joy, David C. |
| author_sort |
Goldstein, Joseph I. |
| title |
Scanning Electron Microscopy and X-Ray Microanalysis. 4th ed. |
| title_short |
Scanning Electron Microscopy and X-Ray Microanalysis. 4th ed. |
| title_full |
Scanning Electron Microscopy and X-Ray Microanalysis. 4th ed. |
| title_fullStr |
Scanning Electron Microscopy and X-Ray Microanalysis. 4th ed. |
| title_full_unstemmed |
Scanning Electron Microscopy and X-Ray Microanalysis. 4th ed. |
| title_sort |
scanning electron microscopy and x-ray microanalysis. 4th ed. |
| publisher |
Springer New York |
| publishDate |
2020 |
| url |
https://scholar.dlu.edu.vn/thuvienso/handle/DLU123456789/94200 |
| _version_ |
1779417543402848256 |